IMSTW 2006 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- About the Location -- Contact -- Committees

Scope & Purpose

The IEEE International Mixed-Signals Testing Workshop (IMSTW) is held annually, alternating between Europe and North America. The IMSTW workshop is a forum for discussing all aspects of testing, design-for-test and reliable design of integrated mixed-signals/mixed-technology functions and systems. This includes testing and design verification of monolithic mixed-signal/mixed-technology systems (SoC), heterogeneous systems including system-in-package and printed circuit board implementations of mixed signal functions. The technology spectrum includes analogue, mixed-signals, high-speed IO, RF, MEMS (inc. optics, bio-chemical and microfluidics), and nanotechnology. Test topics such as design-for-test techniques, BIST, fault diagnosis, test generation, on-line and off-line testing, fault modeling, fault simulation and design of fault tolerant systems are all considered. Mixed-signals infrastructure, embedded core testing and application specific topics are also welcome.

Submissions

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The IMSTW Program Committee invites authors to submit papers in the above areas. Submissions should consist of either an extended summary of at least 750 words or a full paper. Authors of accepted submissions will be encouraged, though not obliged, to prepare a final version of their paper to be included in the informal workshop proceedings. Special issues of the Springer Journal of Electronic Testing: Theory and Applications (JETTA), and the Elsevier Microelectronics Journal will be published based on selected papers from the workshop.

Key Dates:

Submission deadline: February 27th, 2006
Notification of acceptance: April 7th, 2006
Camera-ready full papers: May 8th, 2006

About the Location

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The Workshop will take place in the Sheraton Grand Hotel & Spa in Edinburgh City Centre, Scotland. The hotel is located only a few minutes from the historical Edinburgh Castle and the Royal Mile with its 13th century cathedral and numerous sites of historical significance.

Contact

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Program Information

Prof. Marcelo Lubaszewski
UFRGS Federal University
90035-190 Porto Alegre RS, Brazil
Tel.: +55 51 3316 3516
Fax: +55 51 3316 3293
E-mail : luba@ece.ufrgs.br

Prof. Chau-Chin. Su
National Central University
TW-320 Taiwan R.O.C
Tel. : + 886-3-4264209
Fax: + 886-3-4264209
E-mail: ccsu@cn.nctu.edu.tw

General Information

Prof. Andrew Richardson
Lancaster University
Lancaster, LA1 4YR, UK
Tel.: +44 1524 593018
Fax: +44 1524 592777
E-mail: a.richardson@lancaster.ac.uk

Local Information

George. Bell
Institute for System Level Integration
Alba Campus, Livingston, EH54 7EG, Scotland
Tel.: + 44 1506 469310
Fax: +44 1506 469301
E-mail: George.Bell@sli-institute.ac.uk

Committees

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Organizing Committee

General Chair
A. Richardson, U. Lancaster, UK

Program Co-Chairs
M. Lubaszewski, UFRGS, Brazil
C. Su, U. National Chiao Tung, Taiwan

Program Vice-Chairs
S. Mir, TIMA Labs, France
K.-T. Cheng, UCSB, USA

Publicity Chair
B. Courtois, TIMA Labs, France

Publications Chair
G.Bell, ISLI, Scotland

Program Committee

J. Abraham, U. Texas, USA
K. Arabi, PMC Sierra, Canada
F. Azais, LIRMM, France
I. Bell, U. Hull, UK
J. Carbonero, ST Microelectronics, France
L. Carro, UFRGS, Brazil
A. Chatterjee, Georgia Tech, USA
S. Demidenko, U. Monash, Malaysia
D. De Venuto, Polytechnic of Bari, Italy
J. Figueras, UPC, Spain
G. Force, Texas Instruments, USA
J Machado da Silva, U Porto, Portugal
D. Goodman, Ridgetop, USA
G. Gronthoud, Philips, Netherlands
J.-L. Huang, National U. Taiwan, Taiwan
J. Huertas-Diaz, IMSE-CNM/CSIC, Spain
A. Ivanov, U. British Columbia, Canada
D. Keezer, Georgia Tech., USA
H. Kerkhoff, MESA/U. Twente, Netherlands
B. Kaminska, Simon Fraser U, Canada
L. Milor, Georgia Tech., USA
F. Novak, Josef Stefan Inst., Slovenia
A. Osseiran, Edith Cowan U., Australia
J. Pineda, Philips, Netherlands
M. Renovell, LIRMM, France
A. Rueda, U. Sevilla, Spain
S. Sattler, Infineon, Germany
M. Slamani, IBM, USA
M. Soma, U. Washington, USA
B. Straube, Fraunhofer IIS/EAS, Germany
S Sunter, LogicVision, USA.
P. Teixeira, INESC, Portugal
C Wegener, U. College Cork, Ireland

Liaisons

IEEE: B. Kaminska, USA
IEEE Europe: J. Figueras, UPC, Spain
IEEE Asia-Pac: C. Su, Taiwan
IEEE Latin-America: M. Lubaszewski, Brazil
IEEE North-America: A. Ivanov, Canada

Local Organization: ISLI

Finance: S.O’Hare / L. Quinn (U. Lancaster)
Audiovisuals: K. Georgopoulos (U. Lancaster)
Submissions and Proceedings: G. Bell

For more information, visit us on the web at: http://www.sli-institute.ac.uk/imstw06/

The 12th Annual IEEE International Mixed-Signals Testing Workshop (IMSTW'06) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC) and the Institute for System Level Integration